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Test and validation

PCT5801 and DeepTouch1000 run whole-card electrical test and touchdown.

Chuck force 1,000 kgf · measured at full load

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Model of the PCT5801 and DeepTouch1000 combined cell Model rendering

Whole-card validation for high-pin-count probe cards

From NAND and DRAM to HBM, the pin count needed for one whole-wafer touchdown differs by almost twenty times. On general-purpose probers such as the UF3000 and P-12XL, high-pin-count cards are limited by chuck force. If any link among the ATE, relay matrix, motherboard and probe card is mismatched, whole-card test cannot be completed.

PCT5801 runs end-to-end electrical test covering open, short, leakage (10 nA threshold), control resources and TDR. DeepTouch1000 presses the whole card at 1,000 kgf chuck force and adds 3D probe-tip inspection. Paired in one cell, they map an abnormal channel directly to a coordinate on the card. Motherboards are designed as ODM for the tester platform, and PSTA20K applies the same architecture to package sockets.

From tester to chuck, one path

The tester connects to the probe card through the relay matrix and motherboard, and the prober chuck presses the whole card from below. The blue parts are supplied by Probing.

Test path diagram: the PCT5801 ATE connects through the relay matrix and adapter motherboard to the probe card, which is mounted on the DeepTouch1000 head plate, and the chuck presses the whole card from below Supplied by Probing Probe card under test ATE Relay matrix Adapter motherboard head plate Probe card Whole-card touchdown Chuck DeepTouch1000 PCT5801 test system ATE 256 pin/unit × up to 4 units Relay matrix 1,024 ch/piece × up to 64 pieces Tester channels 16,384 standard, 65,536 maximum Probe card under test Vertical, cantilever and MEMS probe cards Card side 67,000 pin · current platform Probe card adapter motherboard ZIF / POGO contact ring presses on probe card Fits T5830, T5833, M5, V93000 Up to 4,000 pin · V93000 configuration DeepTouch1000 probe station Chuck force 1,000 kgf · measured at full load Z straightness at full load < 0.2 µm 3D probe-tip XYZ inspection Matched to each other for locating and rechecking PCT5801 abnormal-channel coordinates DeepTouch1000 probe-tip XYZ and load
Illustration: drawn from the PCT5801 and DeepTouch1000 combined cell; not to physical scale. For how channels and pins are counted, see Terms and definitions.Swipe sideways to see the full figure.

Equipment

Rendering of the DeepTouch1000 probe station for probe cardsRendering
In production

DeepTouch1000 probe station

Whole-card touchdown at 1,000 kgf chuck force, with 3D probe-tip XYZ inspection.

Chuck force · measured at full load
1,000kgf
Z straightness at full load
< 0.2µm
Product details →View in the hall →
Probe card motherboard contact area: ring-shaped mating face and contact elements grouped by channelContact area · photograph
In production

Probe card motherboards

ODM-designed and built for the tester platform and card type, with the contact structure and routing delivered together.

Maximum channels · V93000 configuration
4,000pin
Test coverage · T5833 FULL
DC + TDR
Product details →
PSTA20K socket tester main unitEquipment category visual
In production

PSTA20K socket tester

Checks package sockets pin by pin for open, short, leakage and contact resistance before processors are installed.

Socket channels · product positioning
5,000channels and above
Current resolution · 500 nA range
0.1nA
Product details →

In development

  • In developmentECP1010 IC substrate test machine →Fully automatic electrical test of embedded-die PCBs: automatic loading, vision alignment, press-in contact and built-in ATE.
  • In developmentCMOS image sensor test solution →Based on the Advantest EVA100, with one APU image-processing board per station and algorithms run locally at the station. EVA100 is Advantest's product; Probing is its representative and distributor and provides mechanical integration.

Maker model names appear here (UF3000, P-12XL, T5830, T5833, M5, V93000, EVA100) to define the range of machines we can take on; they do not indicate authorisation, certification or endorsement by those makers.

Related pages

Memory probe card test systemThe complete solution built from PCT5801 and DeepTouch1000: NAND, NOR, DRAM and HBM probe cards, with 16,384 channels as standard. Pin assemblyPick, align and laser micro-weld, with post-weld inspection forming a closed loop with PCT5801 and DeepTouch1000. TechnologyPin-count scale of NAND, DRAM and HBM probe cards.

Give the engineering team the card type, interfaces and targets

We will acknowledge receipt within one business day.

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