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Prober services

Barcode, plant-network and board interfaces for APM90A and UF200 series probers.

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Prober refurbishment bay: installed UF-series machines are inspected, refurbished and fitted with data interfaces here Prober refurbishment bay · photograph

Older machines are held back by control system and interfaces

The UF200 is a machine of the 1990s and the UF3000 of the 2000s. When they left the factory, lines did not yet ask for barcode scanning, RFID handoff, MES and EAP. Today these are the price of entry to a modern fab or OSAT, and many machines that still work are replaced whole because of them.

The approach is to add this layer outside the machine, built around the UF200 information box, without modifying the machine itself. What the machine already knows is read out and carried into the plant's systems. From there it extends to barcode scanning and lot traceability, EAP and automated material flow.

The control system of the APM90A and UF200 can be upgraded as a whole, and the chuck carrier can be replaced separately.

Underneath it all is the refurbishment of pre-owned probers, testers and parts, each checked machine by machine before delivery. On the test side, we use the Advantest EVA100 as the test front end to build socket and probe card test solutions.

Data path from machine to plant network

The scanner writes the LOT into the machine's native barcode interface. The information box only reads data, and carries what the machine already knows to the board and the plant network.

Data path diagram: the scanner and relay write to the native barcode interface of the installed prober; the prober information box only reads data and sends it to the production board, with link status marked hop by hop toward EAP / MES Developed by Probing Machine and plant Scanner + relay Engineering stage Regex LOT · validated ≤ 18 chars Fails validation: not sent, logged only Written to native barcode interface Installed prober UF200 · APM90A and others Wafer geometry · test counts Cumulative card touchdowns · cleanings Machine screens Machine itself untouched Read-only Nothing written back Information box In development External collection unit Links to machine and plant network Unknown source: locked out Added on, machine program unchanged Plant network Production board (4 pages) Run overview · live UF200 screen Wafer map · EAP (in development) EAP / MES HSMS · GEM, status marked at each hop
Data path diagram (vertical): the scanner and relay write to the native barcode interface of the installed prober; the prober information box only reads data and sends it to the production board, with link status marked hop by hop toward EAP / MES Scanner + relay Engineering stage Regex LOT · validated ≤ 18 chars Fails validation: not sent, logged only To native barcode port Installed prober Machine itself untouched UF200 · APM90A and others Wafer geometry · test counts Cumulative card touchdowns · cleanings Machine screens Read-only, no write-back Information box In development Bolt-on unit; program unchanged Links to machine and plant network Unknown source: locked out Plant network Production board (4 pages) Run overview · live UF200 screen Wafer map · EAP (in development) EAP / MES HSMS · GEM, status marked at each hop Developed by Probing Machine and plant
Illustration: scanner readings are written through the relay to the machine's native barcode interface; the information box sits outside the machine, only reads data, connects to the board, and marks the status of each hop to EAP / MES separately. Barcode entry is at the engineering stage; the information box and EAP interface are in development.
Barcode entry and LOT handling → Prober information box → View the board in the hall →

Products and services

Each item has a matching station in the CP hall.

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Model of the APM90A prober in the hallModel rendering
Retrofit

uP200A control system upgrade

Replaces the control system of APM90A and UF200 series probers, keeping the mechanical body and probe card consumables.

Start-up time · APM90A original 180 s
40s
Supported die per wafer · UF200 original 100,000
250,000die
Product details →View in the hall →
Model of the UF200 with scanner bracket in the hallModel rendering
Engineering stage

Barcode entry and LOT handling

The scanner writes the LOT through a relay into the machine's native barcode interface; if validation fails, nothing is sent.

LOT validation · maximum length
18characters
Scanner · no brand or model lock
USBHID keyboard mode
Product details →View in the hall →
Model of the UF3000ex prober in the hallModel rendering
Refurbished supply

Pre-owned equipment and engineering services

Probers, testers and parts, delivered after serial number, configuration and condition are checked unit by unit.

Refurbished machines in stock · as of August 2026
About 100units
Prober wafer size
8 / 12inch
Product details →View in the hall →
Model of the EVA100 cable connection station in the hall: the test unit sits on a stand beside the proberModel rendering
Agent and application engineering

EVA100 application and test engineering

Develops EVA100 test programs around the actual boards and device specifications, covering CP, FT and failure analysis.

Digital channels · E-Model to P-Model
128~1024ch
Digital channels · base rate
100Mbps
Product details →View in the hall →

Maker model names appear here to define the range of machines we can take on; they do not indicate authorisation, certification or endorsement by those makers. Retrofit and rebuild work is carried out by us and remains our responsibility. EVA100 is Advantest's product; Probing is its representative and distributor. The barcode scanner and the information box are our own development projects, and the badge on each station is the authority on where each one stands.

Related pages

CP hall tourModelled on real machines: six probers in the north row, four docking cells in the south row, four boards on the wall. Test and validationPCT5801 covers end-to-end electrical test. DeepTouch1000 adds whole-card touchdown and 3D probe-tip inspection. Delivery processFrom sample evaluation and technical agreement to factory acceptance (FAT) and site acceptance (SAT).

Tell us the machine model, wafer size and test platform

We reply by machine model with the scope we can take on and a proposed approach.

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