Semiconductor test and probe card equipment

Probe card assembly, test, cleaning and storage equipment

Products include pin-assembly equipment, PCT5801 electrical test, DeepTouch1000 physical inspection, probe card cleaning and RFID storage.

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2008Founded in Shanghai

20+ yearsFounder experience in semiconductor test and equipment applications

16,384Channels in the current high-channel probe card test system

China 10+ / Korea 1Systems listed in product installation records

EQUIPMENT CATEGORIES

Browse by assembly, test, cleaning and storage

Each machine can run independently or exchange Card ID, recipe and inspection data with the other stations.

01 / ASSEMBLY

Probe assembly

Fixtures, vision-assisted alignment, recipe control and post-assembly AOI, XYZ, Pin Force and electrical checks.

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02 / TEST

Test and validation

PCT5801 high-channel electrical test and DeepTouch1000 physical validation, including nA-level leakage, 1000 kgf and probe-tip XYZ.

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03 / CLEAN

Clean and reinspect

Atomized IPA, controlled brushing, clean-gas blowoff and three-direction image inspection.

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04 / STORE

Traceable storage

Controlled environment, RFID, WMS/EAP/MES and manual or automated handoff.

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TEST EQUIPMENT

PCT5801 and DeepTouch1000

PCT5801 checks channel electrical performance; DeepTouch1000 checks probe-tip position, load, probe marks and contact state.

PCT5801 probe card electrical test platform and motherboard rack

PCT5801 electrical test

The current 16,384-channel system covers Open, Short, nA-level Leakage, MCW, control resources and selected high-speed items.

CURRENT SYSTEM · MODULAR 1,024-CHANNEL ARCHITECTUREView technical details

DeepTouch1000 probe card physical validation equipment

DeepTouch1000 physical validation

0-1000 kgf load, probe-tip XYZ, probe mark and contact-state inspection can be linked to PCT5801 anomaly coordinates.

CURRENT SYSTEM · VERTICAL, CANTILEVER AND MEMS CARDSView technical details

High-pin-count AI processor socket test equipment

High-pin-count socket test

Contact and electrical validation for 8,000-20,000-pin AI processor package sockets before processor installation.

BUILT SYSTEM · FIXTURE AND PIN MAP CONFIGURED PER SOCKETView technical details

SELECT BY PROBLEM

What problem are you checking?

Choose the closest symptom to see the suggested equipment and inspection items.

Open circuit or unstable contactOpen, continuity, probe-tip conditionShort or insulation anomalyShort, Leakage, contaminationProbe mark, planarity or force issueLoad, XYZ, contact consistencyParticles, residue or repeated cleaningClean, blowoff, reinspectStorage, issue or traceability gapsRFID, environment, system interfacesProbe assembly consistencyFixture, vision, recipe and validation

COMPANY AND ENGINEERING

Equipment, interfaces and site installation

Probing develops probe card equipment and handles tester, prober, motherboard and factory-system interfaces.

Installed systems

Product records include more than 10 systems in mainland China and one in Korea.

Tester / prober integration

Project paths cover Advantest T5830/T5833/M5, V93000, UF3000, TEL Precio, SEMICS OPUS3 and CNS.

Project delivery

Sample evaluation, technical agreement, FAT and SAT define configuration, interfaces, performance and handoff.

Send the sample information, installed equipment and test requirements

We will acknowledge receipt within one business day and an engineer will follow up.

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