Modular high-channel electrical inspection
PCT5801 Probe Card Electrical Test Platform
PCT5801 sits between the ATE/tester and probe card motherboard. Its 1,024-channel modules, ZIF/POGO interfaces and test recipes handle open, short, leakage, control-resource and selected high-speed checks.
Motherboard and channel rack in a real system. Interface and quantity depend on project configuration.
Equipment and engineering solution
Applications
Designed for the following probe card manufacturing, test and maintenance tasks.
Release and post-repair test
Check opens, shorts, leakage and control resources with a traceable report.
Pre-ATE interface validation
Verify motherboard, channel and basic electrical state before occupying a production tester.
High-channel expansion
Organize capacity around 1,024-channel modules and scale for the card and rack configuration.
SPECIFICATIONS
Specifications
The final configuration follows the card, interfaces, site conditions and acceptance items.
| Item | Specification / configuration | Notes |
|---|---|---|
| System position | ATE/tester → PCT5801 channel/relay → motherboard → probe card | Interface definitions match the actual boards |
| Module capacity | 1,024 channels / piece | Module count follows target channels, rack and interface configuration |
| Core items | Open, Short and Leakage | Limits and ranges follow sample evaluation and the technical agreement |
| Control items | MCW, Relay, FPGA, ASIC, SPI and I²C | Enabled by resource configuration |
| Optional items | AC, TDR, PBDATA and Kelvin | Require corresponding hardware and interfaces |
| Mechanical interfaces | ZIF, POGO and project fixtures | Motherboard structure and changeover are project-defined |
| Data | Configuration version, raw result, judgement and retest record | Supports reporting, traceability and FAT/SAT |
WORKFLOW
Workflow
Define channel mapping
Create a consistent relationship from tester, motherboard and probe card pin map.
Load task configuration
Set item, range, limit, control resources and retest strategy.
Execute and localize
Run tests and locate anomalies to a channel, motherboard or probe-card position.
Publish reviewable results
Preserve raw data, version and judgement; route physical anomalies to DeepTouch when needed.
FAT / SAT
Project delivery
Sample evaluation
Confirm the object, interfaces, current state, failure modes and available validation samples.
Technical agreement
Define configuration, measurement method, limits, takt, data interfaces and responsibilities.
FAT
Verify functions, repeatability, reporting and exception handling with agreed samples.
SAT
Complete site integration, training, upstream/downstream interfaces and issue closure.
CONFIGURATION
Configuration and acceptance
System configuration, optional items and acceptance conditions are summarized below.
System configuration
The current high-channel system supports 16,384 channels.
Modular design
1,024-channel modules are combined for the rack, motherboard and required tests.
Parameter definition
Ranges, limits, high-speed items and Kelvin coverage are set during sample evaluation and technical agreement.
Share the card, interfaces and target
Send the sample, installed equipment, current issue and target takt. We will acknowledge receipt within one business day.