From needle cutting to storage: which tools on this chain are ours
The cost of a probe card rarely stops at purchase: assembly consistency, post-clean residue, storage environment, test criteria — wherever a line lacks the equipment for one of these, the problem surfaces later, in volume production. This MEMS probe-card manufacturing and validation cleanroom lays out the whole chain by its real process bays and marks which parts our equipment covers and which are left to specialist suppliers. Click any tool to zoom in on what it does and the product behind it; the two ends of the room are incoming and shipping.
4 Production · 4 Engineering · 1 Development
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Semiconductor test and equipment
What this workshop is made of, and what it can do
Stations14
We supply4
Flagship pin count300,000
Whole-card force1000 kgf
incoming
assembly
test
clean
storage
ship
The same points in words
What this workshop is made of, and what it can do
Fourteen stations run from incoming stock to shipment. Four of them we supply in production, four are in engineering, one is in development, and the remaining five are steps any such workshop already has.
How the work runs
Card type and the problem
Method and jigs defined
We build the machine
Installed and signed off
We stay with it in production
Drag to orbit, scroll to zoom. Click any tool to fly in and read what it does.
Not supplied
01 · Probe Incoming Inspection and Sorting
Measure and bin probes
Released probes are measured for length, tip form and straightness, then binned and loaded into carrier trays for the assembly line to draw from.
How it works
stock in
check
sort
release
Not supplied
02 · Guide Plate Machining (Vertical Probe Cards)
Machine guide-hole array
Upper and lower guide plates are laser-drilled or EDM-machined with the guide-hole array that constrains each vertical probe and sets its buckling geometry; Probing does not supply equipment for this step.
How it works
datum
drill
verify
handover
Not supplied
03 · PCB / ST Incoming Flying-Probe Test
Electrical check before assembly
Purchased probe card PCBs and space transformers are spot-checked for continuity and resistance on a double-sided flying-probe tester before entering assembly; this equipment is outside Probing's scope of supply.
How it works
board in
probe path
open/short
report
Engineering
04 · Laser probe cutting
Cut to length and drop to tray
Probe stock is fed in as wire or as an array, a laser cuts each probe to the target length, and the cut probe drops into the tray for pickup.
Process chainPick → align → weld
JoiningLaser micro-welding
Post-weld checkAutofocus inspection
Closed loopPCT5801 + DeepTouch1000
How it works
feed
cut
to length
to tray
Engineering
05 · Probe Pick and Alignment
Pick and align the probe
The pick gripper takes each probe from the tray and seats it against the fixed jaw of the alignment stage, which clamps it and corrects attitude and position, with jaw clearance matched to probe thickness.
Process chainPick → align → weld
JoiningLaser micro-welding
Post-weld checkAutofocus inspection
Closed loopPCT5801 + DeepTouch1000
How it works
pick
straighten
hand over
place
Engineering
06 · Laser Micro-Welding Pin Attach
Bond consistency held by recipe, not by feel
The weld gripper takes the aligned probe from the stage, places it on its substrate pad and runs the laser micro-weld, with joint energy and dwell time held in the recipe.
Process chainPick → align → weld
JoiningLaser micro-welding
Post-weld checkAutofocus inspection
Closed loopPCT5801 + DeepTouch1000
How it works
align
laser weld
vision check
to recipe
What we take on
New card introduction
Manual-process standardization
Post-assembly quality loop
01Pick
02Align
03Weld
04Verify
Engineering
07 · Post-Weld Autofocus Inspection
Bond defects found here, not in volume
An autofocus vision unit confirms the weld position and contact face of each finished joint, and the result is written to the work order with material, operator and recipe version, and serves as the contact-position reference for wafer electrical test.
Process chainPick → align → weld
JoiningLaser micro-welding
Post-weld checkAutofocus inspection
Closed loopPCT5801 + DeepTouch1000
How it works
autofocus
position
flag it
to the batch
Production
08 · Probe Tip XYZ and Planarity Metrology
Which pins are out of tolerance, answered by coordinate
The populated card is scanned probe by probe for tip X, Y and Z position, probe length and array planarity, and positions outside the project threshold are flagged by coordinate.
Chuck force1000 kgf
Maximum pins300,000
StructurePB5801 all-in-one
Geometry3D probe-tip XYZ scan
How it works
card in
tip XYZ
planarity
data out
What we take on
High-pin-count card loading
Tip position and consistency
Electrical anomaly review
Incoming probe-card verification
01Confirm card and fixture
02Load and image
03Analyze XYZ and load
04Correlate electrical results
Production
09 · PCT5801 Probe Card Tester (combined cell)
Electrical test and touchdown in one tool, every failing channel tied to a coordinate
PCT5801 and DeepTouch1000 form one combined cell.
Maximum pins67,000 / 300,000
ATE resources256 pin/unit × up to 4 units
Relay matrix1,024 ch/piece × up to 64 pieces
Card interfaceZIF / POGO
How it works
card in
press whole card
electrical
fail to coordinate
Electrical test and touchdown in one toolThe whole card is powered for open, short and nA-level leakage checks while the prober below presses it - the card never moves between two machines.
Every failing channel has a coordinateWhich pin failed and where it sits on the card comes out as a coordinate, instead of being worked backwards by hand.
1000 kgf of contact forceContacting every pin of a high-pin-count card at once needs more than 450 kgf; this cell delivers 1000 kgf with the PB5801 all-in-one structure.
Tip condition in the same passTip geometry and contact state are confirmed in the same pass, so an electrical finding and a mechanical one land in the same record.
What we take on
Release and post-repair test
Pre-ATE interface validation
High-channel expansion
01Open test
02Short test
03Leakage test
04Control test
The actual screen
The tester's main screen: every needle listed by DUT, ZIF and pin position, with an open-circuit and a leakage verdict each.The whole-wafer result map: green passes, red fails; open one cell and you see which needles sit under that die and which tester channel each one reaches.On site: the tester cabinet stands beside the prober, with the whole-wafer result on the screen next to it.Development
10 · Tip grinding and cleaning
Condition tips and clear residue
The card is run over a grinding plate along a set path to condition tip shape and height and to clear residue from the tips.
How it works
card in
grinding plate
re-measure
release
Production
11 · Cleaning and Three-Direction Reinspection
Clean or not is settled by the customer's own acceptance criteria
The card is cleaned by recipe with atomized IPA, controlled soft brushing and clean-gas blow-off with vacuum recovery of residue and particles, then re-imaged from three directions to judge residue, particles, bent probes and abnormal tip shape, with thresholds defined by the customer acceptance method.
DeliveryAtomized IPA
CleaningControlled soft brush
DryingClean gas
ReviewThree-direction images
How it works
recipe clean
dry
three views
pass or rework
What we take on
In-line maintenance
Repeated contamination
Standalone cleaning cell
01Identify and pre-inspect
02Recipe-controlled clean
03Three-direction reinspection
04Release or close the loop
Production
12 · Traceable Storage and Handoff
Where every card has been, on record
Each card is RFID-bound and placed into an environment-controlled slot, with check-in, checkout, return and stocktake driven by WMS/EAP/MES tasks and handoff by manual, AMR, robot or OHT, while capacity and environmental targets are set per project.
EnvironmentNitrogen / ESD / cleanliness
IdentityRFID
InterfacesWMS / EAP / MES
HandoffManual / AMR / robot / OHT
How it works
bind ID
controlled
on request
return on record
What we take on
High-value card custody
Test and cleaning handoff
Automated factory handoff
01Receive and bind identity
02Controlled storage
03Task-driven issue
04Return and audit
Not supplied
13 · Rework and Re-Pinning
Strip and re-weld probes
Cards returned from the fab have damaged or bent probes removed from the substrate and replacement probes welded in before re-entering metrology and electrical test; Probing's cleaning equipment only routes a card to a rework state and its test systems only re-test after repair, so the re-pinning itself is not supplied.
How it works
find it
remove
re-weld
re-check
Not supplied
14 · Packing and Shipment to Fab
Case, document and ship
The released card is put into its shipping case with desiccant and shock protection, documented, and transported to the customer fab's incoming dock.
How it works
final check
pack
with its record
ship
Within this room, probe fabrication, incoming sorting, space transformer and PCB fabrication, guide-plate machining, card body integration, packing and shipment, and re-pinning are handled by specialist suppliers, and the equipment for those steps sits outside Probing's supply scope. Every station marked as ours is marked only from what the product pages on this site already state.
Share the card, interfaces and target
Send the sample, installed equipment, current issue and target takt. We will acknowledge receipt within one business day.