DeepTouch1000 probe card physical validation equipment

Load, probe-tip XYZ and contact evidence

DeepTouch1000 Probe Card Physical Validation

DeepTouch1000 measures 0-1000 kgf load, probe-tip XYZ, probe marks and contact state to establish the physical condition of a probe card. It can correlate inspection coordinates with PCT5801 anomalies for HBM and high-pin-count card validation.

DeepTouch1000 equipment view. Configuration and fixtures follow probe card type and project scope.
Load engineering0-1000 kgfConfigured for card and contact strategy
GeometryProbe-tip XYZFor position and consistency review
Card typesVertical / cantilever / MEMSFixtures and algorithms validated on samples
CorrelationPhysical + electricalCan connect to PCT5801 result flow
Equipment and engineering solution

Applications

Designed for the following probe card manufacturing, test and maintenance tasks.

High-pin-count card loading

Evaluate loading, total force and contact state for HBM and large probe card projects.

Tip position and consistency

Use XYZ data and images to locate offsets, planarity or contact differences.

Electrical anomaly review

Align PCT5801 anomalous coordinates with probe-tip, mark and load evidence.

SPECIFICATIONS

Specifications

The final configuration follows the card, interfaces, site conditions and acceptance items.

ItemSpecification / configurationNotes
Load range0-1000 kgfWorking point is set for card type and contact strategy
Inspection itemsTip X/Y/Z, contact state, probe mark and loadAlgorithms and limits are set with sample validation
Probe card typesVertical, cantilever and MEMSConfigured with corresponding fixture, field of view and recipe
Integration routePB5801 integrated station; PCT5801 electrical-data correlationSystem combination selected per project
TemperatureTri-temperature optionTemperature range follows equipment configuration and test conditions
Optional capabilityPin Force / Contact inspectionConfigured by sensor, card type and acceptance method
Data outputXYZ, image, load and judgement recordsSupports anomaly review and FAT/SAT
WORKFLOW

Workflow

01

Confirm card and fixture

Define card structure, datum, load range, inspection area and safety conditions.

02

Load and image

Apply the recipe and capture tip, contact or probe-mark images.

03

Analyze XYZ and load

Calculate position and load, then flag locations outside project limits.

04

Correlate electrical results

Link PCT5801 coordinates and judgements to a traceable retest conclusion.

FAT / SAT

Project delivery

01

Sample evaluation

Confirm the object, interfaces, current state, failure modes and available validation samples.

02

Technical agreement

Define configuration, measurement method, limits, takt, data interfaces and responsibilities.

03

FAT

Verify functions, repeatability, reporting and exception handling with agreed samples.

04

SAT

Complete site integration, training, upstream/downstream interfaces and issue closure.

CONFIGURATION

Configuration and acceptance

System configuration, optional items and acceptance conditions are summarized below.

Standard capability

Supports load up to 1000 kgf and probe-tip XYZ inspection.

Optional functions

Tri-temperature, Pin Force and Contact are configured for card type and test method.

Acceptance

Fixtures, algorithms, limits, repeatability and task time are confirmed with real samples.

Share the card, interfaces and target

Send the sample, installed equipment, current issue and target takt. We will acknowledge receipt within one business day.