Probe card mother board with a central contact ring and channel harnesses

The board between the card and the tester

Probe Card Mother Boards

When a probe card will not run on a tester, the problem is often neither the card nor the machine but the mother board between them. It does two jobs at once: mechanically it sets how the card is pressed, aligned and loaded; electrically it sets trace length, impedance control and how many channels actually come out. Probing designs and builds them as ODM for the tester platform and the target card, delivering the contact structure and the routing together.

A mother board in the shop: probe card contact area at the centre, channel harnesses grouped around it. Interface and quantity depend on platform and card type.
PlatformsT5830 / T5833 / M5 / V93000
Highest channel count4,000 pins
Test coverageDC and AC (TDR)
Delivery modelODM
The same points in words
Platforms
Mainstream memory and SoC testers
Highest channel count
The V93000 configuration
Test coverage
AC available on the T5833 FULL configuration
Delivery model
Designed and built per platform and card
Equipment and engineering solution

Applications

Designed for the following probe card manufacturing, test and maintenance tasks.

A new card on an existing tester

Channel expansion

Adding AC test

Isolating a contact failure

The same points in words
A new card on an existing tester
Rebuild the mother board around the card's contact scheme and signal definition.
Channel expansion
Moving from 8 TOM to 32 TOM or FULL, the mother board decides how many channels actually come out.
Adding AC test
TDR transfer-time measurement on an existing platform depends on controlled trace length and impedance in the board.
Isolating a contact failure
Verify the mother board on its own when contact resistance rises or channels drift, instead of suspecting the probe card by association.
SPECIFICATIONS

Specifications

The final configuration follows the card, interfaces, site conditions and acceptance items.

Advantest T5830 · 8 TOMDC test available; AC test built to order as ODMDelivered configuration
Advantest T5830 · 32 TOMDC test available; AC test built to order as ODMDelivered configuration
Advantest T5833 · FULLBoth DC and AC (TDR) test availableDelivered configuration
Teradyne M5 · SSV / XVDC test available; AC test built to order as ODMDelivered configuration
Advantest V93000 · 4,000 pinsDC test available; AC test built to order as ODMHighest channel count among delivered configurations
Configuration range8 TOM / 32 TOM / FULL / SSV / XV, up to 4,000 pinsSelected by platform and card type
See the full specification table
ItemSpecification / configurationNotes
Contact and routingStable contact structure with low-resistance routingContact resistance and signal integrity are the board's two basic measures
Other platformsBoards for T2000, 93K-DD and UltraFlex are assessed per projectA platform outside the delivered list needs a feasibility check first
WORKFLOW

Workflow

  1. 01

    Confirm platform and card

  2. 02

    Structure and routing design

  3. 03

    Build and assemble

  4. 04

    Verify electrically, then deliver

The same points in words
Confirm platform and card
Fix the tester model, the TOM / FULL configuration, and the card's contact structure and signal definition.
Structure and routing design
Set the contact structure, contact element type, layer count and impedance targets.
Build and assemble
Machine the board, fit the contact elements, and check mechanical fit against card and test head.
Verify electrically, then deliver
Run opens, shorts, contact resistance and, where required, TDR on PCT5801 before delivery.
FAT / SAT

Project delivery

01

Sample evaluation

02

Technical agreement

03

FAT

04

SAT

The same points in words
Sample evaluation
Confirm the object, interfaces, current state, failure modes and available validation samples.
Technical agreement
Define configuration, measurement method, limits, takt, data interfaces and responsibilities.
FAT
Verify functions, repeatability, reporting and exception handling with agreed samples.
SAT
Complete site integration, training, upstream/downstream interfaces and issue closure.
CONFIGURATION

Configuration and acceptance

System configuration, optional items and acceptance conditions are summarized below.

Delivered configurations

8 TOM and 32 TOM for Advantest T5830, FULL for T5833, SSV / XV for Teradyne M5 and the 4,000-pin configuration for Advantest V93000 have all been designed, built and delivered.

Where AC stands today

The T5833 FULL board carries both DC and TDR AC test. On the other platforms AC is built to order as ODM, not an off-the-shelf capability.

Production deployment

Boards are in production use at several wafer fabs. Customers, unit counts and projects are not disclosed.

Position in the test path

The PCT5801 path runs ATE, relay matrix, mother board, probe card. A mismatch at any of the four stops whole-card testing, and the mother board is the link most often underestimated.

Share the card, interfaces and target

Send the sample, installed equipment, current issue and target takt. We will acknowledge receipt within one business day.