Probing Semiconductor 中文 / EN / 日本語 / 한국어 Submit a request

Cleaning and reinspection

The equipment cleans cantilever and vertical probe cards by recipe, and releases them after three-direction image reinspection.

Model of the cleaning and three-direction reinspection equipment: enclosure, probe card on the stage and operator screen Model rendering

Residue and particles judged before release

Residue left after cleaning affects the cost of a probe card, as assembly consistency, storage environment and test criteria do. Without equipment for this stage, problems surface late, in volume production.

The equipment runs atomized IPA, controlled soft brushing and clean-gas blow-off by recipe. Three-direction images then judge residue, particles, bent probes and abnormal morphology. Judgement thresholds are defined by the customer's acceptance method.

Equipment

All products →
Model of the cleaning and three-direction reinspection equipmentModel rendering
In production

Probe card cleaning and three-direction reinspection equipment

Cleans cantilever and vertical probe cards by recipe, then releases or reworks them after three-direction image reinspection.

Liquid supply
Atomized IPA
Reinspection
Three-direction images

Share the card type, contaminated samples and acceptance method

We will acknowledge receipt within one business day.

Send a request