Prober in service

40 s boot · 250,000 dies · Chinese UI

uP200A Prober Control System Upgrade

On a 200 mm prober from the 1990s the mechanics are usually still sound; what holds it back is the control system and its interfaces - slow to boot, dated screens, data that will not come out, nothing that meets today's demand for scanning, traceability and automation. The control-system upgrade replaces that layer: about 40 seconds to boot, 250,000 dies per wafer, a full Chinese interface, and continued compatibility with the original probe cards, consumables and data formats. The point is not to turn an old machine into a new one, but to keep it in the schedule of a modern line.

Category visual of a prober. The upgrade targets APM90A and UF200 series machines already in service.
Boot time40 s
Dies supported250,000
Processing speedThree times UF200
InterfaceChinese
The same points in words
Boot time
APM90A takes 180 s
Dies supported
APM90A 60,000, UF200 100,000
Processing speed
As stated in the catalogue
Interface
Original is English or Japanese
Equipment and engineering solution

Applications

Designed for the following probe card manufacturing, test and maintenance tasks.

Capacity limited on an older machine

Interface and data format friction

Protecting the existing consumable investment

The same points in words
Capacity limited on an older machine
The mechanics are still usable but the control system's die limit and takt have become the bottleneck.
Interface and data format friction
The original machine runs an English or Japanese interface with floppy-only data transfer.
Protecting the existing consumable investment
The plan is to keep using the original probe cards and consumables rather than repurchase.
SPECIFICATIONS

Specifications

The final configuration follows the card, interfaces, site conditions and acceptance items.

Upgrade targetTokyo Seimitsu APM90A and UF200 series probers in serviceMechanical body is retained
Boot timeuP200A 40 s; UF200 70 s; APM90A 180 sCatalogue comparison table
Dies supporteduP200A 250,000; UF200 100,000; APM90A 60,000Per wafer
Wafer sizes4, 5, 6 and 8 inchBackward compatible
Data transferFloppy, magneto-optical disk and networkOriginal machines offer floppy, or floppy plus network
Data formatCompatible with UF200 and UF200A data formatsThe original APM90A is not
See the full specification table
ItemSpecification / configurationNotes
Consumable compatibilityCompatible with APM90A and UF200 probe cards and consumablesNo repurchase required
Overall accuracy5 μmAs stated in the catalogue
Chuck8 inch nickel/gold heatable chuckWith the 8 inch control module
FunctionsPad auto-alignment, tip auto-alignment and cleaning, fail-mark check, multi-probe probing, multi-bin output, live mapping displayLCD touch monitor
InterfacesGPIB and TTLFor host system integration
UtilitiesCompressed air >0.4 MPa; vacuum >-53 kPa; single phase 220 V; max load current 6 A; max power 1.5 kVASite conditions must be met
Supplying entityShanghai Wenlan Trading / Shanghai Lude Integrated CircuitDifferent from the probe card equipment supply entity
WORKFLOW

Workflow

  1. 01

    Confirm machine and condition

  2. 02

    Confirm data and interfaces

  3. 03

    Perform the upgrade

  4. 04

    Verify

The same points in words
Confirm machine and condition
Confirm the model, control system state and existing consumables Defines the upgrade scope
Confirm data and interfaces
Confirm mapping data format and host system interfaces Covers GPIB, TTL and network
Perform the upgrade
Replace the control system, keep the mechanical body and consumables Carried out on site
Verify
Confirm boot time, die count, alignment and mapping output Measured results govern
FAT / SAT

Project delivery

01

Sample evaluation

02

Technical agreement

03

FAT

04

SAT

The same points in words
Sample evaluation
Confirm the object, interfaces, current state, failure modes and available validation samples.
Technical agreement
Define configuration, measurement method, limits, takt, data interfaces and responsibilities.
FAT
Verify functions, repeatability, reporting and exception handling with agreed samples.
SAT
Complete site integration, training, upstream/downstream interfaces and issue closure.
CONFIGURATION

Configuration and acceptance

System configuration, optional items and acceptance conditions are summarized below.

Source

Boot time, die count, data transfer and compatibility comparisons come from the model comparison table in the uP200A product catalogue.

Scope

This page covers control system upgrades for APM90A and UF200 series legacy machines and does not apply to current generation probers.

Not published

Upgrade lead time, spare part coverage and warranty terms depend on the specific machine and are not given as general values in the source.

Share the card, interfaces and target

Send the sample, installed equipment, current issue and target takt. We will acknowledge receipt within one business day.