Products

Semiconductor test systems and adjacent equipment lines.

Probe-card testing, socket testing, ATE, PCT5801, DeepTouch, and surplus equipment together form the current product surface.

Portfolio

Product and equipment lines.

Probe-card testing, socket testing, ATE, PCT5801, DeepTouch, and surplus equipment.

Built for one-touchdown memory probe card workflows across NAND, NOR, DRAM, and higher pin-count validation scenarios.

Dedicated socket test coverage for AI processor packages where pin count and contact quality become the critical bottleneck.

Integrated circuit automatic test equipment for digital and mixed-signal workflows, with debugging, shmoo, and virtual instrument support.

Probe card electrical test platform with current mother board paths for T5830 / T5833, M5, and 93K, plus DC, AC / TDR, Kelvin, and control checks.

Automated probe card test machine with 1000 kgf chuck force, XYZ needle-tip inspection, and all-in-one operation with PCT5801.

Front-end equipment, wafer probers, tester families, and inventory coordination for semiconductor equipment workflows.

Workflow shape

Memory probe card validation, AI processor socket validation, integrated circuit test, and surplus equipment support.

PCT5801 covers DC, AC, TDR, and on-board IC checks for memory probe cards and adjacent tester connections.

DeepTouch focuses on contact force, 3D tip position, and the physical side of probe-card inspection.

Socket test, EVA100 / ATE, and surplus equipment support adjacent production workflows.