Advantest EVA100 and adjacent ATE workflows.
EVA100 sits alongside the rest of the company’s testing surface, with clear workflow fit and debugging scope.
EVA100 sits alongside the rest of the company’s testing surface, with clear workflow fit and debugging scope.
EVA100 is positioned for mid-range digital, analog, and mixed-signal IC test requirements, with CP / FT coverage and engineering debug tools.
Designed by Advantest for mid-low end digital and mixed-signal component test demand, inheriting T2000 software and hardware foundations.
Relevant test targets include logic, power management, comparators, amplifiers, audio / video converters, sensors, and related mixed-signal devices.
Covers wafer-level CP test and finished-device FT test, with use cases around IP validation and failure analysis.
The EVA100 workflow includes graphical debug tools and online utilities for engineering bring-up and characterization.
Voltage meter, current meter, voltage source, current source, and clock source style instrumentation.
Sequence editor, pin / timing / level setup tools, and device-block debugging support.
Two-dimensional variable sweep and shmoo-style debug for characterization work.