DeepTouch1000 is the physical and operational side of the system: incoming validation, contact and pin-tip evaluation, wafer-sort support, high chuck force, and all-in-one integration with PCT5801.
DeepTouch1000 is an automated probe card test machine for incoming validation, electrical testing, contact-performance evaluation, tip consistency inspection, and wafer-sort-oriented operation.
1000 kgf chuck force supports higher pin-count probe-card handling.
The machine is positioned around contact performance evaluation, needle-tip consistency checks, and visual / measurement-driven inspection.
Supports vertical, cantilever, and MEMS probe cards, with full-temperature validation needs and configurable automation / expansion options.
