EVENT REVIEW · CONCLUDED
SWTest 2026
From June 8-10, 2026 at SWTest in Carlsbad, Probing Group presented probe card electrical test, physical validation and high-pin-count systems at Booth 303.
On-site topics
Wafer test and probe technology
Technical discussions focused on PCT5801 high-channel electrical test, DeepTouch1000 physical validation and the memory probe card system.
Electrical validation
Open, Short, nA-level Leakage, control resources and selected high-speed items.
Physical validation
0-1000 kgf, probe-tip XYZ, probe marks and contact state.
System integration
Tester, prober, motherboard and result traceability in one route.
Next
Continue the technical discussion
Share card type, interfaces and sample information from the product pages to continue a probe card or high-pin-count project.
The event ended; engineering discussions continue
Share samples, installed equipment and project conditions. We will acknowledge receipt within one business day.