EVENT REVIEW · CONCLUDED
SWTest 2025
SWTest 2025 was held in San Diego. It is a conference focused on wafer test, and Probing used it to exchange practice on whole-card validation and contact force with engineering teams from the probe-card and wafer-test community.
On-site topics
What was shown
The stand centred on probe-card test and touchdown: whole-card electrical test, contact force and tip condition were the three things visitors asked about most.
Whole-card test
Open, short and leakage checks, with every failing channel tied to a coordinate.
Contact force
Where the force needed for whole-card validation comes from, and how it is read.
After the show
Send the card type, pin count and current issue to continue on configuration.
Next
Project contact
Send the sample, the equipment in place and the test requirement, and an engineer will follow up.
The event ended; engineering discussions continue
Share samples, installed equipment and project conditions. We will acknowledge receipt within one business day.