EVENT REVIEW · CONCLUDED
SEMICON China 2026
From March 25-27, 2026 at SNIEC in Shanghai, Probing demonstrated high-channel probe card electrical and physical validation equipment and discussed motherboards, tester/prober interfaces and high-pin-count projects.
On-site topics
Equipment demonstrations and technical discussions
The booth focused on memory probe card test, motherboard interfaces, high-channel electrical checks and DeepTouch physical validation.
Equipment demonstrations
The team demonstrated probe card electrical and physical validation equipment and test workflows.
Interface discussions
Conversations covered motherboards, contact validation, tester/prober integration and project interfaces.
Photo record
Ten photographs cover equipment, the booth, operation demonstrations and customer discussions.
Next
Continue the technical discussion
For probe cards, tester/prober interfaces or high-pin-count projects, share samples and project conditions from the product pages.
The event ended; engineering discussions continue
Share samples, installed equipment and project conditions. We will acknowledge receipt within one business day.