Probing Semiconductor
Probing booth and team at SEMICON China 2026

ON-SITE PHOTOS · 10

Equipment, booth and technical discussions

Selected scenes cover equipment demonstrations, structure reviews and customer discussions.

Back to event review
Probing booth and on-site team
Probing booth and on-site team
Live demonstration of the high-channel probe card test system
Live demonstration of the high-channel probe card test system
Engineering discussion with international visitors
Engineering discussion with international visitors
Motherboard and probe-card interface discussion
Motherboard and probe-card interface discussion
Visitor reviewing the probe-card holding structure
Visitor reviewing the probe-card holding structure
Equipment operation and test-flow explanation
Equipment operation and test-flow explanation
Discussion around the one-touchdown test system
Discussion around the one-touchdown test system
Visitors reviewing equipment structure and test steps
Visitors reviewing equipment structure and test steps
Close review of the probe-card test station
Close review of the probe-card test station
Discussion of equipment configuration and project requirements
Discussion of equipment configuration and project requirements