存储器探针卡检测设备Memory Probe Card TesterPCT5801
针对一次扎针型大规模存储器探针卡，适配市面主流存储器测试机，提供包括DC、AC的全面测试项目，并可测试集成在探针卡上的元器件。
Designed for one-time-touchdown memory probe card test, capable for mainstream memory tester on the market.t provides comprehensive test coverage, including both DC and AC parameters, and supports testing of components integrated into the probe card itself.
PCT5801
面向对象：
Targets:
单次全部扎针式探针卡检测.
One-time-touchdown whole wafer contact probe card test
适用测试机型号:
Capable Testers:
Advantest T5375, T5377, T5830, T5833 , T5221(UnderDevelopment)
Teradyne M5
测试项目:
Test Items:
DC: Open-Short, pin-to-pin Leakage (5nA resolution), MCW Control
AC: TDR (Time-domain-refletion, which is called /PBDATA in Advantest systems)
On-board IC test: ASIC, FPGA, Relay array
Mother Boards
提供主流存储器测试机的针卡适配，可搭配任意探针台进行测试。基于常年探针台服务经验，目前已经实际搭配过以下探针台:UF3000ex, UF3000, OPUS3, CNS
Fit for mainstream memory tester probe cards, and could dock with any type of prober. Based on long-term working experience on probers, already docked with UF3000ex, UF3000, OPUS3 and CNS.
Advantest T5830
480mm and 520mm
8TOM,16TOM,32TOM
Advantest T5833
v1 : DC function only
v2: DC and AC (/PBDATA) Test full coverage
Teradyne M5
客制化专业界面Customized User Interface
简单易用，完全图形化界面，无需编程经验，excel格式导入/导出MotherBoard模板、测试项目、测试结果。
Easy to use, fully GUI, no programming skill required, import/export MotherBoard template in excel format as well as test item and result.
主控界面
Main Panel
可深度化定制的测试界面，包含测试平台、针卡管理、测试项、结果等等。
Customized test interface, including test platform, probecard management, test item and result, etc.
实时显示针卡测试进度和结果Real-time display of probe card test and result
实时显示整个针卡的测试状况，并可以显示任意一个site的测试项目与结果。
Real-time display the full scale of the probe card test, and show the test item and result of any selected site from the probe card.
我们的努力 Our Efforts
20+
多年经验深耕半导体领域
Years in Semiconductor Industry
100%
客户专注
Customer Focus
10+
已出货设备
Shipped Equipments
100+
已检测针卡项目
Completed Probe Card Test Project
我们的客户Our Customers
一心一意服务客户，扎根中国，走向世界，为半导体产业的发展贡献自己的微薄之力。
With unwavering dedication to serving our customers, we are deeply rooted in China and boldly stepping onto the global stage — determined to contribute our strength, however humble, to the thriving future of the semiconductor industry.
我们的客户怎么说Response From Customers
刘志广
道格特科技·CTO兼CEO
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迪娜·马罗
威廉·布朗
CTO如是说
PCT5801探针卡测试系统在测量精度、系统稳定性和操作效率等各方面表现出色，超出我们的预期。其先进的硬件平台与智能化软件架构深度融合，即使在复杂测试条件下也能输出一致且高精度的结果。我们尤其赞赏其团队在半导体设备领域的专业素养与响应速度，能够将工程挑战转化为可靠且可量产的解决方案，是我们值得信赖的重要合作伙伴。
“The PCT5801 probe card test system has exceeded our expectations in every aspect — from measurement accuracy to system stability and operational efficiency. Its advanced hardware platform, combined with intelligent software architecture, delivers consistent, high-precision results across complex test conditions. We are particularly impressed by the team’s deep expertise and responsiveness; their ability to translate engineering challenges into reliable, production-ready solutions makes them a truly valuable partner in the semiconductor equipment space.”