业界首台探针卡测试专用高刚性(1000kg)探针台Industry First 1000kgf Prober for Probe Card Test

设备完美契合我司自研存储器探针台测试系统PCT5801，实现自动化数据通讯和生产。

Perfectly all-in-one with our self-designed memory probe card test system PCT5801, achieving automatic data communication and production.

按照目前的针卡发展蓝图，不久的未来将攀升到300000针，这需要750kgf乃至1000kgf的承载台盘来托举整个针卡的压力。我们的设备在实现高刚性托举的同时，可以实时显示当前针压、Z-up数据，还可对应三温测试环境。

According to the current development roadmap for probe cards, the pin count is expected to reach 300,000 in the near future, which will require a stage capable of supporting a load of 750 kgf to even 1000 kgf. Our equipment not only provides high-rigidity support to bear the full pressure of the probe card, but also offers real-time display of probe force and Z-up data, and is fully compatible with tri-temperature testing environments.

去除传统量产探针台的Loader port / OCR等单元，最小化占地面积

Without Loader port and OCR comparing with traditional mass-production probers, minimize footprint

可进行针尖耐久次数测试、针尖清洗功能

Needle multiple-time stroke test, perform needle cleaning

高速检查所有针尖的针长、XYZ位置及平面度，用于整体确认和定位维修。

Inspect all needle with Tip Length / XYZ position / Planarity, for total check and maintenance.

10000pin@10minutes，60000pin@60minutes

检测单根针的受力针压，可行程单回路进行电性检测。

Measure single pin force and test electrical parameters with the close circuit.