Controlled cleaning
Atomized IPA, light brushing, and clean-gas blowoff with project recipes for different probe types.
Project-configured platform · cleaning criteria frozen with samples
Probe card cleaning with reinspection and traceability.
Build a closed loop with atomized IPA, controlled soft brushing, clean-gas blowoff, and three-direction particle reinspection, standalone or integrated with test and storage.
Turn “cleaned” into a result that can be judged.
Media, brushing motion, gas parameters, and reinspection thresholds are defined by probe type and samples. Exceptions can route to reclean or isolation.
Three-direction particle reinspection
Inspect particles and tip condition from multiple directions and retain the judgement evidence.
Standalone or inline
Operate as a standalone machine or integrate with electrical/morphology inspection and storage.
Particle size, cleanliness, brush cycles, and reclean decisions are not universal constants. They require customer samples, probe types, and a technical agreement.
Cleaning inside the full judgement loop.
The source design connects cleaning with electrical, morphology, and particle inspection. RFID and a common Card-ID keep the before/after result tied to the same probe card.
- InputCard identity, probe type, incoming state, and recipe
- ProcessAtomized IPA, controlled brush contact, clean-gas blowoff
- JudgementParticle and tip condition from three viewing directions
- ExceptionReclean, reinspect, isolate, or return to storage
Sample-led cleaning qualification.
Cleaning criteria are frozen against agreed contaminated and acceptable samples, not inferred from a generic marketing specification.
Samples and criteria
Confirm probe type, contamination samples, and judgement standards.
Fixtures and recipes
Define handling, brush contact, media, interfaces, and safety.
FAT
Verify cleaning, reinspection, records, and exception handling.
SAT and traceability
Freeze recipes, versions, training, and service after site acceptance.